EventDetails

Speaker:
PD Dr. Regina Hoffmann-Vogel, Universität Konstanz

In Kelvin-Probe Force Microscopy, the work function difference between the tip and the sample of a scanning force microscope (SFM) is determined locally. The first example given in this talk is the quantum size effect of Pb islands grown on Si(111). The measurements show an evenodd oscillatory dependence of the local work-function difference on the island’s height [Fig. 1]. The second example are molecular layers, where the work function measurement yields information about step edges and other line defects as well as the orientation of the molecular layers. The third example are vicinal Si surfaces where we obtained atomic resolution. The distribution of surface dipoles is governed by the Smoluchowski effect.